Abstract

以Gd2O3和正硅酸乙酯(TEOS)为原材料,采用并流化学共沉淀法合成Gd2SiO5粉体材料。研究Gd2SiO5前驱体的热响应特征、Gd2SiO5粉体的物相组成和微观形貌,并对Gd2SiO5粉体的合成机理进行初步探讨。结果表明:前驱体的低Gd/Si摩尔比和反应体系的高pH值会导致Gd2SiO5粉体生成Gd9.33(SiO4)6O2杂质相,相反则会导致生成Gd2O3杂质相。当Gd/Si摩尔比为20∶11、pH值为9~10、合成温度为1000~1300 ℃时,合成的粉体纯度较高,Gd2SiO5颗粒呈不规则形貌特征,平均粒度为100~200 nm。Gd2SiO5合成过程中,前驱体以一种—[Si—O—Gd]—网络结构存在,在煅烧过程中逐渐转化为Gd2SiO5晶体以及Gd9.33(SiO4)6O2和Gd2O3杂相。

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