Abstract
The intercalation of Cu adsorbed onto 1T TaSe2 and TiSe2 (0001) van der Waals planes as well its deintercalation by adsorbed Br2 is studied by synchrotron induced photoelectron spectroscopy and low energy electron diffraction. Cu intercalation into 1T TaSe2 leads to a change in lattice distortion (charge density waves) as is evident from a transition of a commensurate √13x√13 to a 3×3 superstructure and changes in Ta 4f core line and valence band spectra. For 1T TiSe2 intercalation follows closely the rigid band model. After adsorption of Br2 at 100 K and annealing to room temperature a CuBr overlayer is detected on both samples. The substrate spectra indicate the deintercalation of near surface Cu. The experimental results suggest that the diffusion of Cu proceeds normal to the van der Waals plane.
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