Abstract
Cesium-induced structural transformation from the Si(113)3×2 to the 3×1 surface has been investigated by using low energy electron diffraction and synchrotron radiation photoemission spectroscopy. We measured the change of work-function, core level (Si 2p,Cs 4d), and valence band spectra with increasing cesium deposition time. As previously reported, cesium induced the structural transformation from the Si(113)3×2 to the 3×1 surface at the initial stage of adsorption. Two shoulders (S1,S2) in Si 2p core level and one (SS1) of dangling bond surface states (SS1, SS2) in valence band spectrum from the 3×2 surface disappeared with the structural transformation to the 3×1. These results show that surface atoms in sp2- and s2p3-like configurations on the 3×2 surface are changed to sp3-like ones during the structural transformation. Therefore, the cesium-induced structural transformation seems to be related to the reduction of elastic energy by the donation of valence electrons from cesiums.
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More From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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