Abstract
Large single domain YBa 2Cu 3O x materials have been successfully fabricated with superb RF properties by employing the seeded melt growth (SMG) method. Grown samples were diced, polished and oxygenated. Surface resistances of various samples were measured by a cavity perturbation technique. A sapphire loaded parallel plate cavity was used. Measured results indicate that surface resistance of the SMG bulk samples approaches that of high quality YBCO thin films.
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