Abstract
Various organic semiconductor thin films were deposited on an indium tin oxide (ITO) electrode/glass substrate to simulate organic solar cells. The electrical properties at the organic/inorganic and organic/organic interfaces were evaluated by dynamic-mode atomic force microscopy (DFM) together with Kelvin probe force microscopy (KFM). By employing the frequency modulation (FM) method, the DFM/KFM system allows for not only consistent imaging over a wide scanning area, but also highly sensitive detection of the surface potential. The charge carrier behavior at the interface was clarified by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM and depicting the energy band diagram with band bending in the fullerene (C60) film.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
