Abstract
Second-harmonic microscopy (SHM) is a fast, non-contact, surface-sensitive imaging technique for the quantitative in situ characterisation of a large variety of real interfaces. In conventional second-harmonic generation (SHG) experiments the surface symmetry and order averaged over the illuminated area are obtained. In contrast, SHM allows us to measure the susceptibility of any feature resolved in the images. The local susceptibility can be interpreted in terms of local molecular order and symmetry. The resolution limit of the stigmatic microscope is Abbe's limit for the frequency-doubled light.
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