Abstract
Nanostructured thin films on a silicon substrate were obtained by high-frequency repetitively pulsed (f ~ 10–15 kHz) laser action with a wavelength of 1.064 μm and a power density q = 54 MW/cm2 on La0.4Ba0.6CoO3 ceramics at a vacuum chamber pressure p = 2.2 Pa. The morphology of the obtained films was studied using atomic-force microscopy. Features of transmission spectra in the visible, near-, and mid-IR regions were revealed. The electrophysical properties of the La0.4Ba0.6CoO3 structure were analyzed.
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