Abstract
Potential-induced degradation of the shunting type (PID-s) has recently been recognized by the industry as a critical photovoltaic (PV) module durability issue. Many methods to prevent PID-s have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a prospective method for eliminating or minimizing the PID-s issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning Willow Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.
Accepted Version
Published Version
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