Abstract
Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.
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