Abstract
High quality, very flat Nd 1.2Ba 1.8Cu 3O y thin films have been grown by sputtering on TiO 2 terminated SrTiO 3 (100) single crystals and their surface structure have been determined by using Grazing Incidence X-ray Diffraction (GIXD) technique, employing synchrotron radiation. A 52 unit cells film presents a double terminated surface composed by a complete and ordered Cu(1)–O plane and a disordered Cu(1)–O plane partially covered by a BaO layer, in full agreement with scanning tunneling microscopy data. A preliminary comparison between the structure of 8 and 52 u.c. NdBCO films will be presented.
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