Abstract
High quality, very flat ${\mathrm{Nd}}_{1+x}{\mathrm{Ba}}_{2\ensuremath{-}x}{\mathrm{Cu}}_{3}{\mathrm{O}}_{y}$ films have been grown by sputtering and analyzed by low energy electron diffraction, scanning tunneling microscopy (STM) and grazing incidence x-ray diffraction (GIXD) employing synchrotron radiation, in order to investigate the surface structure and morphology. The refinement of the GIXD data has been performed on the basis of structural models sensitive to the nature of the terminating layer. The interpretation of the results provides a picture of the surface structure that is in full agreement with STM results. The surface is composed by two terraces with different termination, one of which is an ordered and complete Cu(1)-O layer and the other an incomplete BaO layer that partially covers a disordered Cu(1)-O layer. Atomic vacancies and steps bounding terraces with a height of about $0.4\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, are present on the surface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
