Abstract
The interface region character of Au-Cu superlattices has been studied. Superlattice samples were vacuum deposited at room temperature. In order to increase the influence of the interface slope on X-ray diffraction spectra the superlattice unit cells of some samples consisted of two double layers of gold and copper. The structure of the samples was studied using a statistical model of the superlattice structure. The thickness of the interdiffused interface region has been estimated by comparison of experimental with simulated X-ray diffraction spectra. Information about the terrace growth of superlattices is presented. Results show that it is possible to perform a detailed analysis of the interface on the basis of X-ray diffraction measurements in spite of the obtention of an “averaged” image of a sample structure.
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