Abstract
X-ray diffraction (XRD) method to measure the residual stress in the metal substrate surface layer and the medial oxide layer between thin film and metal substrate was introduced and the sol-gel TiO2-SiO2 thin film was successfully prepared on SUS304 stainless steel substrate by dip-coating process. The macro residual stress existing in metal substrate was analyzed by XRD. It turns out that the compressive stress existing in the metal substrate surface layer decreases with the raising of heat-treated temperature and that the compressive stress of metal substrate surface layer and the tensile stress of the medial oxide layer increase with the increase of the withdrawal speeds of the sol-gel dip-coating. Based on the above study, colored stainless steels of high quality were prepared by sol-gel process for the first time.
Published Version
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