Study of structural, dielectric, transport and optical properties of the CaMn0.94Ce0.06 O3 Ceramic

Abstract

We report the structure, microstructure, dielectric, transport, and optical properties of the CaMn0.94Ce0.06O3 ceramic synthesized by the solid-state reaction method. Analysis of the X-ray diffraction (XRD) pattern of the sample adopts an orthorhombic crystal symmetry. A study of scanning electron microscope (SEM) micrograph shows the homogeneous distribution of the well-grown grains over the entire surface of the sample. The well-defined and distinct grain boundaries surrounding the compact grains may be a possible reason for a better conductivity mechanism in the sample. The study of the energy dispersive x-ray (EDX) spectrum provides information about the formation of high-purity samples and also confirms the presence of Ca, Mn, Ce and O in both weight and atomic percentages. The agglomeration rate during the sintering process may be a possible reason for a better dielectric and conductivity mechanism. Fourier-transform infrared spectroscopy (FTIR) study strongly supports the presence of all constituent element’s atomic vibration bands. The study of the UV visible spectra provides the idea of semiconducting nature and bandgap energy of 4.89 eV. At a low range of frequency, the presence of the Maxwell-Winger type of dielectric dispersion is confirmed. Dielectric properties were investigated, including conductivity, dielectric constant, dielectric loss, and complex modulus. According to impedance analysis, primarily the charge carriers’ long-range movement controls the conduction process. The semiconducting nature of the sample is confirmed by analysis of the Cole-Cole plots.