Abstract
Mismatch and parasitic effects of bridge capacitors in successive-approximation-register analog-to-digital converter’s (SAR-ADC) split capacitor digital-to-analog conversion (DAC) cause a significant performance deterioration. This paper presents a nonlinearity analysis based on an analytical model, and a modified calibration method utilizing a pre-bias bridge capacitor is accordingly proposed. The proposed method, which uses three-segment split capacitor DAC structure, can effectively eliminate over-calibration error caused by conventional structure. To verify the technique, a 14-bit SAR-ADC has been designed in 0.35-[Formula: see text]m 2P4M CMOS process with the PIP capacitor, and the simulation results show the method can further improve ADC performance.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
