Abstract
Al-C 60 thin films were prepared in vacuum by the co-evaporation method. The structural and physical properties of the films have been studied with transmission electron microscopy and Raman scattering spectra. The growth of C 60 crystallites is significantly limited by co-deposition of aluminum. Raman spectra showed in these films that the A g (2) pentagon-pinch mode of C 60 splits into two peaks, corresponding to the pristine and softened A g (2) modes, respectively. The shifts of the softened A g (2) mode are about 6 to 9 cm -1 , and depend weakly on the microstructures of the films. In addition, there is a substantial variation of the ratio between the intensity of the softened and unsoftened A g (2) mode. The experimental results could be understood based on the model of Al-C 60 interfacial interaction.
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