Abstract
In(OH) x S y buffer layers have been deposited on glass/Mo/CIGS substrates. Composition, reflectance and morphology of those heterojunctions have been studied. The XPS results have shown that the CIGS substrate does not influence the buffer layer composition, which only depends on deposition conditions. Nevertheless, strong variations of CIGS total reflectance take place after the deposition of this buffer layer. It has been also observed that the In(OH) x S y layer shapes the CIGS substrate and totally covers its surface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
