Abstract

Photoemission in modern high brightness electron sources is under studies at the PITZ photo injector. Space charge dominated photoemission in the presence of high RF field at the semiconductor photocathode is studied. By utilizing core and halo particle distributions based on measured radial laser profiles, simulations reproduce the behaviour of the measured emission curves for a wide range of RF gun parameters within the measurement uncertainties for Gaussian laser pulses. But applying this model to the case of long flattop photocathode laser pulses revealed discrepancies between experimental data and simulation results. Corresponding emittance simulations have been compared to measurements for both temporal profiles of the photocathode laser.

Highlights

  • High brightness electron sources are key components for the successful operation of modern Free Electron Lasers (FELs) like the European XFEL and FLASH

  • For the European XFEL photo injector 1 nC electron bunches with ~20 ps length and normalized emittance of

  • Experimental minimization of the transverse emittance for a wide range of electron bunch charges resulted in optimum photo injector parameters which correspond to the space charge dominated regime of photoemission from the Cs2Te cathode

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Summary

Introduction

High brightness electron sources are key components for the successful operation of modern Free Electron Lasers (FELs) like the European XFEL and FLASH. A high brightness electron source for such modern applications requires rather high bunch charge and very small transverse normalized emittance. For the European XFEL photo injector 1 nC electron bunches with ~20 ps length and normalized emittance of

Published under licence by IOP Publishing Ltd
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