Abstract
The real long term aging phenomena at ambient temperatures, over 8 years, of amorphous TbFe thin films protected with a SiO x layer has been investigated, using Kerr magneto-optic effect. Our data indicate significant changes in the coercivity values for films with less than 500A thickness. In thicker films structure/stress relaxation effects appear to be significant. Studies of the stability of these films under accelerated aging are also presented.
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