Abstract
Changes in the local magnetic properties and structure of amorphous TbFe thin films, induced by ion implantation, have been investigated in comparison with amorphous GdCo thin films. The samples were obtained by rf co-sputtering on glass substrates. X-ray diffraction and Rutherford backscattering spectrometry (RBS) have been used for structural and compositional analysis. Local hysteresis loops and coercive forces were studied by magneto-optic polar Kerr effect. Structural investigations showed the films to be completely amorphous, before as well as after implantation. Magneto-optical measurements pointed to a progressive diminution of local hysteresis loop area and to a specific behaviour of the relative coercive force for TbFe and GdCo samples, with increasing dose. Both effects were explained by the alteration of magnetic properties in the implanted layer.
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