Temperature dependence of the magnetic properties of amorphous TbFe thin films determined from hall effect measurements

Abstract

Measurements of the extraordinary Hall effect as a function of temperature for amorphous TbFe thin films of various thicknesses and compositions were performed to investigate the thickness dependence of the magnetic properties previously observed for rare earth-transition metal thin films. It is found that a change in the composition alters the temperature dependence of the extraordinary Hall resistivity ρ H( T). The change in ρ H( T) with film thickness is found to be much greater than that which can be ascribed to a change in the composition alone. These experimental results support our previously proposed model that the microstructure-induced variations in the short-range order are the dominant reason for the change in the magnetic properties with film thickness.