Abstract
X-ray photoelectron diffraction (XPD) patterns of In 3d core levels have been measured for the Si(001)-(4×3)-In surface. An R factor analysis with single-scattering and multiple-scattering simulations of In 3d XPD patterns was performed for three structural models proposed so far. Only the model proposed by surface X-ray diffraction [Appl. Surf. Sci.123/124, 104 (1998)] appeared to give a reasonably small R factor when the geometric parameters were modified from the original ones.
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