Abstract

X-ray photoelectron diffraction (XPED) patterns for A12p, Ga3d and As3d from Ga1-xAlxAs (110) are measured. XPED patterns for Ga3d and As3d show characteristic differences due to the difference in atomic sites of Ga and As atoms in Ga1-xAlxAs crystal. On the other hand, the XPED pattern for A12p is almost identical to that for Ga3d. The results show a clear corresondence between XPED patterns and sites of photoelectron emitter atoms in the crystal. Based on the results, applicability of XPED measurements to direct atomic site determination of foreign atoms in a crystal surface layer is discussed.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.