Abstract
High resolution electron microscopy (HREM) combined with crystallographic image processing (CIP) is becoming a powerful technique for solving inorganic structures. With the image processing systems CRISP and ELD, running on a personal computer, this technique can be easily established in other laboratories. HREM images and electron diffraction patterns are digitized by a CCD camera and transferred into a PC. Phases and amplitudes are extracted from the Fourier transform of the HREM images. For thin crystals of metal oxides, the phases obtained by HREM and CIP inside the Scherzer resolution of the microscope are identical to the x-ray structure factor phases.Electron diffraction extends to much higher resolution than EM images (beyond 1 Å). The quality of the amplitudes is also higher than that from images, since ED data is not affected by the contract transfer function (CTF). Amplitudes extracted by ELD are close to x-ray diffraction amplitudes (within 30%).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
