Abstract
The magnetic properties and crystal texture of rf-sputtered CoCrTa thin films deposited on different NiFe underlayers have been investigated. A CoCrTa thin film deposited on a ‘strong’ (111) textured NiFe underlayer exhibits a strong c-axis texture oriented perpendicular to the plane of the film. The structure and properties of a sputter-deposited CoCrTa thin film were found to be very sensitive to the crystal texture of the NiFe underlayer. Higher coercivity is obtained on films with random crystal orientation distributions, while lower coercivity is obtained on the highly textured films. Such behavior may be attributed to the induced local energy fluctuation associated with the crystal orientation distribution. It is clear that the crystallographic structure of NiFe underlayers significantly affects the magnetic properties of CoCrTa/NiFe films.
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