Abstract
This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.
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