Abstract
Perovskite ferroelectric Pb0.60Ca0.20Sr0.20TiO3, Pb0.50Ca0.25Sr0.25TiO3 and Pb0.40Ca0.30Sr0.30TiO3, thin films were deposited on Pt/Ti/SiO2/Si and (100) LaAlO3 substrates by a chemical solution deposition method. XRD revealed the formation of pure thin films on both substrates. All thin films have very flat surfaces, and no droplets were found on their surfaces. Raman data showed a gradual phase transition from tetragonal to a pseudocubic perovskite structure in these thin films; a simultaneous increase in Ca and Sr contents at room temperature was also observed. Temperature-dependent dielectric permittivity measurements revealed a decreasing ferroelectric-to-paraelectric phase transition temperature with increasing Ca and Sr contents. At 100kHz, ferroelectric-to-paraelectric phase transition temperatures were approximately 505, 355 and 290K for Pb0.60Ca0.20Sr0.20TiO3, Pb0.50Ca0.25Sr0.25TiO3 and Pb0.40Ca0.30Sr0.30TiO3 thin films, respectively. The Eg of the films were estimated from Tauc׳s law and were found to be inversely dependent on the Ca and Sr content amounts.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
