Abstract
We have synthesized \(Pb\left( {Sn_x Ti_{1 - x} } \right)O_3\) (PST) with x=0.45, 0.55, 0.65 ferroelectric ceramics by a solid-state reaction technique and performed preliminary X-ray diffraction (XRD) analysis and the temperature and frequency dependence dielectric measurements on them. The a.c. and d.c. conductivities have been investigated over a wide range of temperature and the activation energy \(\left( {E_{a.c.} and E_{d.c.} } \right)\) have also been calculated. It is observed that: (i) the relative dielectric permittivity (e) and loss tangent (tan δ) are dependent on frequency, (ii) the temperature of dielectric permittivity maximum shifts toward lower temperature side, (iii) permittivity maximum decreases with the increase of Sn content in the (PST) compounds and (iv) no frequency dispersion of the dielectric permittivity reveals the no-relaxor behavior of the materials.
Published Version
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