Abstract
In this work, we investigated the structural properties of ferroelectric PbZr0.2Ti0.8O3 (PZT) and ferrimagnetic/ferroelectric [CoFe2O4(CFO)/PZT] bilayers grown on (001)SrTiO3 (STO) substrates with 50 nm thick LaNiO3 bottom electrodes via X-ray diffraction by θ-2θ scan, reciprocal space mapping (RSM), rocking curve, and phi-scan modes. Interestingly, structural properties of the PZT layer exhibited remarkable changes after the top-layer CFO deposition. Both the c- and a-domains exist in the PZT layer by the data acquired and the tetragonality of the PZT decreases after the CFO top-layer deposition.
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