Abstract
In this paper, we present a method which employs X-ray diffraction in transmission geometry for structural determination of Langmuir–Blodgett (LB) films. The LB multilayers are deposited on the outer surface of a thin glass capillary and diffraction pattern was recorded using a pin-hole flat camera. The remarkable advantage of this method is that both the multilayer reflections and in-plane reflections are recorded in one diffraction pattern which provides the following information about the film: layer thickness, electron density profile normal to the layers, in-plane packing of molecules and tilt angle of molecular chains with respect to the plane. As an example, we have determined the lattice parameters and the electron density profile of a lead stearate LB film according to one diffraction pattern where 15 orders of layer reflections and three in-plane reflections were recorded.
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