Structural and UV photoluminescence properties of single crystalline SnO 2 films grown on α - Al 2O 3 (0001) by MOCVD

Abstract

High-quality single crystalline SnO 2 films have been deposited on α-Al 2O 3 (0001) substrates by metalorganic chemical vapor deposition (MOCVD). The structural and photoluminescence (PL) properties of the SnO 2 films were investigated. The prepared samples were epitaxial single crystalline films with the rutile structure of pure SnO 2. A single and sharp ultraviolet (UV) PL peak near 331 nm was observed at room temperature (RT). At a temperature of 13 K, two other narrow PL peaks located at 369 and 375 nm as well as a broad feeble peak near 500 nm were observed. The corresponding PL mechanisms were investigated.