Structural and impedance spectroscopy characterization of Stannic oxide electronic system

Abstract

Stannic oxide (SnO2) is explored as one well-known material for many potential applications due to its unique electronic properties. The objective is to focus on structural and electrical characteristics of SnO2 electronic material, synthesized through the high-temperature solid-state principle. The sample has a tetragonal system, which is revealed by the X-ray diffraction technique. Different electrical parameters are comprehensively analyzed with the help of impedance spectrometer. The studied material has a relatively high dielectric constant and low tangent loss which furnish it as a suitable applicant for electronic applications.