Abstract
An interference reflector consisting of two barium stearate steps (~1000 A and 2000 A in height) on chromium, has been devised as the basis of a simple method for the simultaneous determination of refractive index (n2) and thickness (d2) of nonabsorbing unimolecular films. The measured variables are the two interference fringe displacements produced when an unknown film is cast simultaneously over both steps. From these fringe shifts, n2 and d2 may be calculated easily by the use of approximations good to three significant figures. The method is sensitive enough to determine n2 to within 1% and d2 to within 4% for films ⩾20 A in thickness. Measurements and computations for an unknown film may be completed in under 2 hr. Experimental verification is in a separate paper.
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