Year-end Sale % OFF 
Abstract
High-transparency polymers, called optical polymers (OPs), are used in many thin-film devices, for which the knowledge of film thickness (h) and refractive index (n) is generally required. Spectrophotometry is a cost-effective, simple and fast non-destructive method often used to determine these parameters simultaneously, but its application is limited to films where h > 500 nm. Here, a simple spectrophotometric method is reported to obtain simultaneously the n and h of a sub-micron OP film (down to values of a few tenths of a nm) from its transmission spectrum. The method is valid for any OP where the n dispersion curve follows a two-coefficient Cauchy function and complies with a certain equation involving n at two different wavelengths. Remarkably, such an equation is determined through the analysis of n data for a wide set of commercial OPs, and its general validity is demonstrated. Films of various OPs (pristine or doped with fluorescent compounds), typically used in applications such as thin-film organic lasers, are prepared, and n and h are simultaneously determined with the proposed procedure. The success of the method is confirmed with variable-angle spectroscopic ellipsometry.
Highlights
Accepted: 28 July 2021High-transparency polymer thin films, either pristine or doped with some other material, are increasingly used in the fabrication of electronic and optical devices, motivated by their low cost, easy fabrication and mechanical flexibility
The increase in the refractive index for very thin samples, shown in variable angle spectroscopic ellipsometry (VASE) measurements, is found in measurements performed with the proposed spectrophotometric method
It is important to discuss the instrumental systematic errors associated with It is important to discuss the instrumental systematic errors associated the use of the proposed method. Even though these errors can be reduced by regular use of the method. Even these errors be reduced by regula calibration andproposed maintenance, we found thatthough the comparison of thecan spectrum of a clean tion and maintenance, we foundspectrum that the obtained comparison of the spectrum of a clean uncoated substrate with the theoretical from Equation
Summary
High-transparency polymer thin films, either pristine or doped with some other material, are increasingly used in the fabrication of electronic and optical devices, motivated by their low cost, easy fabrication and mechanical flexibility. Examples of such devices are organic field-effect transistors [1], light-emitting diodes [2], solar cells [3], or thin-film organic lasers (TFOLs) [4]. These highly transparent polymers, called optical polymers (OP). Spectrophotometry has lower accuracy, but it is cost-effective and the analysis is simpler and requires less time [6]
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
