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Abstract
We present variable angle spectroscopic ellipsometry characterization of polymeric films for optoelectronics. This characterization allows us to monitor the thickness variation of the films through the main steps of the process, suggesting possible improvements of the process itself. Spectroscopic characterization of baked but non-oriented films suggests strong interaction between the chromophores. Finally, the measurements allow us to calculate the birefringence of corona-poled films throughout their transparency domain.
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