Abstract
The SIRAD facility at the 15 MV Tandem accelerator of the INFN Legnaro Laboratory is dedicated to characterizing the global sensitivity of electronic devices and systems to single event effects (SEE) due to energetic ion impacts. We are extending the SEE study program to include ion electron emission microscopy capabilities. The prototype system, on standby for installation on the ion beam line, is working in a photon electron emission microscopy configuration to test the basic detector and acquisition system here described.
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