Abstract
The scatter of critical current of bent Bi2223 composite tape was analyzed from a statistical viewpoint. It was revealed that the increase in scatter of the critical current beyond the irreversible bending strain is attributed to the heterogeneous damage evolution. Further modeling analysis, based on the heterogeneous damage evolution, revealed that the distribution of the damage strain parameter-value, which refers to the difference between the intrinsic tensile damage strain and residual strain of the Bi2223 filaments, is described by the two parameter Weibull distribution function, from which the distribution of the normalized critical current value is described by the three parameter Weibull distribution function.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
