Analysis of distribution of critical current of bent-damaged Bi2223 composite tape

Abstract

Distributions of critical current of damaged Bi2223 tape specimens bent by 0.6, 0.8 and 1.0% were investigated analytically with a modelling approach based on the correlation of damage evolution to distribution of critical current. It was revealed that the distribution of critical current is described by three parameter Weibull distribution function through the distribution of the tensile damage strain of Bi2223 filaments that determines the damage front in bent-composite tape. Also it was shown that the measured distribution of critical current values can be reproduced successfully by a Monte Carlo simulation using the distributions of tensile damage strain of filaments and original critical current.