Abstract
Dynamic force microscopy (DFM) with the self-oscillator (SO) method is not generallysubjected to the instability effects typical of tapping-mode DFM, as confirmedexperimentally. The inherent stability of SO-DFM is related to phase locking of thecantilever oscillation to the excitation signal. Such phase locking determines univocally theoscillation state (i.e. amplitude and frequency) on the resonance curve, even when multipleamplitude values are compatible with a given frequency. By modelling the behaviour of anair-operated DFM system, it is found that, while stabilizing tip/surface distance for DFMimaging at constant frequency shift, and beyond a certain critical phase value,instabilities are possible in the SO constant-excitation amplitude mode. However, suchinstabilities cannot affect dynamic force spectroscopy approach curves, because of phaselocking. By extension to vacuum operation, this result can confirm the origin ofjumps in frequency shift found on some experimental DFM approach curves, forinstance between non-passivated silicon tips to specific surface atomic sites ofreconstructed silicon, since instrumental effects of the SO method can be ruledout.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
