Abstract
The results obtained on spin-dependent processes via electrically detected magnetic resonance (EDMR), capacitance-detected magnetic resonance (CDMR) and noise-detected magnetic resonance (NDMR) in a variety of different semiconductor materials, devices and nanostructures are reviewed. Similar to optically detected magnetic resonance (ODMR), these detection methods are significantly more sensitive for the detection of paramagnetic states and defects than conventional electron spin resonance (ESR) and can be applied also to semiconductors with an indirect band gap. Using GaAs/AlGaAs-heterostructures and thin films of amorphous hydrogenated silicon (a-Si:H) as examples, the physics of spin-dependent recombination and its detection via spin-dependent photoconductivity is briefly recapitulated. EDMR on pn-diodes from GaP, GaAsP and group-III nitrides, resonant spin–spin scattering in strained Si/SiGe heterostructures, new hysteresis effects in the longitudinal magneto-transport through two-dimensional electron gases and edge-magneto plasmons in different III–V heterostructures are discussed. Various aspects of ferromagnetic III–V semiconductors are investigated, including doping of GaN with Mn, inhomogeneous magnetization of GaMnAs and control of ferromagnetism in semiconductors via hydrogen. Finally, preliminary EDMR experiments on the detection of single paramagnetic defects in MOSFETs via random telegraph noise are presented. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
