Abstract
Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model
Published Version
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https://doi.org/10.1007/s00339-021-04681-9
Journal: Applied Physics A | Publication Date: Jun 17, 2021 |
Citations: 2 |
Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model
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