Abstract

Automatic spectroscopic ellipsometry (SE) with a 0.75 - 6.5 eV photon energy range was used together with atomic force microscopy to investigate surface optical and structural characteristics of as-deposited, annealed, and chloride treated Cd/sub 1-x/Mn/sub x/Te thin films. The E/sub 1/, E/sub 1/ + /spl Delta//sub 1/, and E/sub 2/ critical-point structures were clearly observed in the SE data for as-deposited samples. The variation of the pseudodielectric function for as-deposited samples was observed under different surface preparation and measurement conditions by in situ SE. The AFM images of the corresponding as-deposited samples revealed variations in surface morphology that were consistent with the SE results. For chloride treated samples, the pseudodielectric function was much different from that of as-deposited samples. This difference was due not only to oxidation of the surface, but also to a disruptive change of the bulk film under such annealing conditions.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.