Abstract
AbstractFundamentals of x‐ray fluorescence spectrometry and X‐ray emission spectrometry in the case of electron probe x‐ray microanalysis and low‐energy electron induced x‐ray spectrometry are compared. The different aluminum and titanium compounds occurring in steel can be investigated by examining soft x‐ray spectra, arising from valence shell orbitals. The non‐metallic inclusions were isolated by galvanometric electrolysis. In the case of the speciation of titanium, direct electron bombardment of the sample is used to generate soft x‐rays. By investigating the Ti L lines, titanium carbide, nitride and sulfide can be distinguished. To specify aluminum compounds, the Kβ transition in the x‐ray fluorescence spectrum was examined. The concentration of aluminum oxide and nitride in precipitates of special steel qualities can be determined with a satisfactory determination limit. Finally, pre‐operational studies for the determination of different silicon inclusions using electron excitation were carried out. Copyright © 2003 John Wiley & Sons, Ltd.
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