Abstract
In the year 2013, IEEE Test Technology Technical Council (TTTC) took an initiative to establish a forum involving young professionals (both from industry and academia) working in the broad domain of manufacturing test, diagnosis, debug, yield improvement and related areas. We organized panel meetings in conjunction with VLSI Test Symposium (VTS) and International Test Conference (ITC) last year to focus on the professional needs identified by the young colleagues that TTTC can help address. This is the third successive meeting of this forum that involves a diversified group of young professionals currently employed in the leading US semiconductor/EDA companies and in academia. The session will be held in town-hall format, organized by Dr. Alodeep Sanyal from Intel, and moderated by Dr. Yervant Zorian from Synopsys. The panelists will be involved in defining the charter for this newly-formed TTTC forum and establish a committee that will actively engage in monitoring these activities. Few of the focus areas include: (a) Create and maintain a webpage for Young Professionals (YP) Forum linked with the TTTC webpage, (b) Establish and nurture professional collaboration between young colleagues in academia and industry, (c) Create and maintain an employment opportunity database for graduating students. We invite everybody to attend the panel and voice their opinion from the audience.
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