Special session 11C: Young professionals in test — Elevator talks

Abstract

This session is organized as part of the activities sponsored by IEEE Test Technology Technical Council (TTTC) Young Professionals Forum. The primary goal of this forum is to align the young professionals, both from industry and academia, working in the broad domain of manufacturing test and applications, with the activities of TTTC. This forum was initiated in 2013 and had its first meetings at VLSI Test Symposium (VTS) and International Test Conference (ITC) of that year. This year we are expanding our presence in the VTS by introducing a new session showcasing the research conducted by the young colleagues from industry and academia. The Elevator Talk session includes presentations on “Malicious Aging Acceleration in Processors” by Naghmeh Karimi from New York Polytechnic University, “RF Built-In Test with Non-intrusive Sensors” by Haralampos Stratigopoulos from TIMA Laboratory, France, “Advanced Process Bring-up” by Sounil Biswas from nVidia, “Exploration of Vector-based Integer Arithmetic on Intel Xeon Processors” by Michail Maniatakos from New York University, Abu Dhabi and “Detecting Hardware Trojans with Self-Reference Timing Tests” by Eshan Singh from Intel Corporation. Through this Elevator Talk session, we encourage a broader section of young colleagues to participate in the similar session of future meetings.