Abstract
SOXS is a computer code which uses input trace element concentrations to produce a simulated PIXE spectrum. In either thick or thin targets, for element concentrations from μg g −1 to 100% , the X-ray yield of an element can be estimated given its concentration in a sample. This yield can be converted to a complete set of element characteristic X-ray peaks. The basic Gaussian representation of the peaks can be distorted by adding low energy tailing or step functions. Adding the characteristic X-ray peaks for each element to one of the libraries of standard backgrounds gives a complete PIXE spectrum. Some uses of SOXS are discussed including the estimate of detection limits for a wide range of trace elements in a given target matrix. Any detector geometry and filter condition can be simulated, allowing detailed experiment planning and feasibility decision making. Both K and L lines can be used, giving an element range from Na to U in the calculation.
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