Abstract
A silicon-based magnetometer utilizing spin-dependent recombination to electrically detect electron spin resonance is described. Electronic tracking of the resonant frequency provides an absolute, calibration-free measure of the magnetic field. The magnetometer can potentially be implemented entirely in conventional complementary metal–oxide–semiconductor (CMOS) integrated circuit technology. Based on published results for spin-dependent recombination in semiconductor diodes, an estimate of the achievable sensitivity and power consumption of an integrated magnetometer is derived.
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