Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions

Cleiton Magano Marques, Cristina Meinhardt + Show 1 more

https://doi.org/10.1007/s10836-021-05944-2

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Journal: Journal of Electronic Testing	Publication Date: Apr 1, 2021
Citations: 2

Abstract

Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions

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