Abstract
A comparison study of the adaptability of several commercially available diffractometers for X-ray absorption fine- structure studies was carried out. The following experimental arrangements were tested: 1. Continuous scanning with a proportional counter recording total counts accumulated at predetermined intervals. 2. Point-by-point scanning (manual and automatic) using a scintillation counter, a proportional counter, and a geiger counter. Several kinds of slit geometries, X-ray tubes, and sample thicknesses have been tested. All measurements were carried out using copper foils having minimum preferred orientation and silicon single-crystal analyzers. The results were compared to those obtained using a two-crystal instrument employing two parallel silicon crystals and a scintillation counter followed by a pulse-height analyzer. It is concluded that comparative measurement can be carried out with commercial instruments but that quantitatively accurate absolute determinations of the edge structure require more highly stabilized X-ray generators than those presently manufactured.
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