Abstract

This paper presents some of the results obtained by using the modified envelope method, which takes substrate absorption into account. Samples investigated in this paper are the series of amorphous thin chalcogenide uniform films from system Cux[As2(S0.5Se0.5)3]100−x. Thin films were deposited under vacuum on glass substrates by thermal evaporation technique, from previously synthesized bulk samples. The dispersion of the refractive index is discussed in terms of the single oscillator model proposed by Wemple and DiDomenico. By using this model, i.e. by plotting (n2−1)−1 against (ℏω)2 and fitting a straight line, oscillator parameters, E0 – the single oscillator energy and Ed – the dispersion energy, were directly determined.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.